Immunofluorescence stimulated emission depletion microscopy
Immunofluorescence stimulated emission depletion microscopy
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DOI：
10.1038/nbt897
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发表时间：
2003-11-01
影响因子：
46.9
通讯作者：
Hell, SW
中科院分区：
文献类型：
--
作者：
Dyba, M;Jakobs, S;Hell, SW
我们报告免疫荧光成像的空间分辨率远远超过衍射极限。轴向分辨率为50 nm，对应于793 nm辐照波长的1/16，通过对向透镜的受激辐射损耗实现。我们不仅证明了抗体标记的标签足够稳定，可以在这种显微镜模式下记录，而且可以使用标准的免疫荧光制剂获得亚衍射分辨率。
We report immunofluorescence imaging with a spatial resolution well beyond the diffraction limit. An axial resolution of 50 nm, corresponding to 1/16 of the irradiation wavelength of 793 nm, is achieved by stimulated emission depletion through opposing lenses. We have demonstrated not only that an antibody-tagged label is stable enough to be recorded in this microscopy mode, but also that subdiffraction resolution can be obtained using a standard immunofluorescence preparation.