Markov process reliability model for photovoltaic module failures
Markov process reliability model for photovoltaic module failures
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DOI：
10.21014/acta_imeko.v6i4.428
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发表时间：
2017-12
期刊：
影响因子：
--
通讯作者：
L. Cristaldi;M. Khalil;M. Faifer
中科院分区：
文献类型：
--
作者：
L. Cristaldi;M. Khalil;M. Faifer
This paper presents a Markov process reliability model for a photovoltaic module. This model includes all the possible failures associated to the operation of a Photovoltaic (PV) module. Failure modes are identified in detail, afterwards all the possible failure states of the PV module during the service are considered. Finally, a complete Markov process is attained to assess the probability of each failure mode occurrence and estimate the mean time to failure, probability density function of the time to module failure, hazard and survival functions of a PV module.
