Modeling the effects of surface roughness on the emissivity of aluminum alloys

Modeling the effects of surface roughness on the emissivity of aluminum alloys
复制标题

DOI:
10.1016/j.ijheatmasstransfer.2006.04.037
复制
发表时间:
2006-11-01
影响因子:
5.2
通讯作者:
Mudawar, Issam
Mudawar, Issam
中科院分区:
工程技术2区
文献类型:
--
作者:
Wen, Chang-Da;Mudawar, Issam

文献摘要

被引文献

相似文献

本研究探讨了铝合金表面发射率与表面粗糙度之间的关系。讨论了两种能对粗糙表面发射率进行良好整体预测的方法。一种方法是使用数学多光谱辐射测温(MRT)模型来计算发射率,并通过辐射测量确定表面温度以及发射率模型中的经验常数。这种方法需要为每种表面形貌确定新的发射率常数。本研究还提出了一种确定粗糙表面发射率的替代方法。该方法依赖于确定单个参考表面的发射率特性,并通过将粗糙表面的表面粗糙度函数(由表面形貌仪器测定)与参考表面的相关联,来推断相同材料的任何其他粗糙表面的发射率。利用具有不同表面粗糙度程度的AL 7075的数据,表明这种方法比第一种方法具有更高的准确性。(c)2006爱思唯尔有限公司。保留所有权利。
This study explores the relationship between the emissivity of aluminum alloy surfaces and surface roughness. Two methods are discussed which yield good overall predictions of the emissivity of rough surfaces. One method consists of using a mathematical multispectral radiation thermometry (MRT) model for the emissivity and determining both the surface temperature and the empirical constants in the emissivity model from radiance measurements. This method requires new emissivity constants to be determined for each surface topography. This study also presents an alternative method for determining the emissivity of rough surfaces. This method relies on determining the emissivity characteristics of a single reference surface and inferring the emissivity of any other rough surface of the same material by relating a surface roughness function (determined by surface topography instrumentation) of the rough surface to that of the reference surface. Using data for AL 7075 with various degrees of surface roughness, this method is shown to yield better accuracy than the first method. (c) 2006 Elsevier Ltd. All rights reserved.