Single-Crystal Scintillation Materials
Single-Crystal Scintillation Materials
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DOI:
10.1007/978-3-540-74761-1_50
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发表时间:
2010
期刊:
影响因子:
--
通讯作者:
M. Nikl;A. Vedda;V. Laguta
中科院分区:
文献类型:
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作者:
M. Nikl;A. Vedda;V. Laguta
Scintillation materials are employed to detect x-ray andγ-ray photons or accelerated particles. Wide-bandgap semiconductor or insulator materials with a high degree of structural perfection are suitable for this purpose. They must accomplish fast and efficient transformation of incoming high-energy photon/particles to a number of electron–hole pairs collected in the conduction and valence bands, respectively, and their radiative recombination at suitable luminescence centers in the material. Generated ultraviolet (UV) or visible light can then be detected at high sensitivity by conventional solid-state semiconductor- or photomultiplier-based photodetectors, which are an indispensable part of scintillation detectors.An insight into this field will be provided for a wider scientific audience and at the same time we will point out some current hot topics. After reviewing the historical issues and fundamental physical processes of the x(γ)-to-visible light transformation occurring in scintillators, practically important material parameters, characteristics, and related measurement principles will be summarized. An overview of selected modern single-crystal and optical ceramic materials will be given. Particular attention will be paid to the relation between the manufacturing technology used and the occurrence of material defects and imperfections. The study and understanding of related trapping states in the forbidden gap and their role in the energy transfer and storage processes in the material will be shown to be of paramount importance for material optimization. Correlated experiments of time-resolved luminescence spectroscopy, wavelength-resolved thermally stimulated luminescence, and electron paramagnetic resonance offer a powerful tool for this purpose. Future prospects and directions for activity in the field will be briefly mentioned as well.