Direct measurement of recurrent fluorescence emission from naphthalene ions
Direct measurement of recurrent fluorescence emission from naphthalene ions
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直接测量萘离子的重复荧光发射
DOI：
10.1103/physreva.102.012820
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发表时间：
2020
影响因子：
2.9
通讯作者：
Tsuchida H.
中科院分区：
文献类型：
--
作者：
Saito M.;Kubota H.;Yamasa K.;Suzuki K.;Majima T.;Tsuchida H.
在这项研究中，使用静电离子束阱萘离子的复发性荧光进行了研究。在电子碰撞产生萘离子后，测量了跃迁时荧光的光子数随时间的变化。在约10 ms的时间范围内观察到的光子的发射。在这样长的时间范围内的光子数的变化可以解释通过进行模拟使用先前报道的理论速率常数的碎片和经常性的荧光振动热萘离子。
In this study, the recurrent fluorescence of naphthalene ions was investigated using an electrostatic ion beam trap. The number of photons from the recurrent fluorescence on thetransition was measured as a function of time, after the production of naphthalene ions by electron impact. The emission of photons was observed over a time range of approximately 10 ms. The variation in the number of photons for such a long time range could be explained by conducting simulations using previously reported theoretical rate constants of both the fragmentation and the recurrent fluorescence of vibrationally hot naphthalene ions.