Comparison of two optimization techniques for the estimation of complex permittivities of multilayered structures using waveguide measurements

Comparison of two optimization techniques for the estimation of complex permittivities of multilayered structures using waveguide measurements
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使用波导测量估计多层结构复介电常数的两种优化技术的比较

DOI:
10.1109/tmtt.2005.855133
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发表时间:
2005
影响因子:
4.3
通讯作者:
Manohar D. Deshpande
Manohar D. Deshpande
中科院分区:
工程技术1区
文献类型:
--
作者:
M. Baginski;D. Faircloth;Manohar D. Deshpande

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在本文中,使用两种独立的技术,即顺序二次规划(SQP)和遗传算法(GA)来估计多层复合结构中每层的复介电常数。通过将每种算法应用于三个不同的误差函数之一来表征算法的相对性能。最初使用计算机生成的 S 参数数据集来确定每种算法可实现的精度。基于这些数据集以及使用标准 X 波段波导程序获得的单层和多层样品的 S 参数测量结果,GA 被确定为在最小化测量/生成和制定的 S 参数的均方根误差方面更稳健的算法。研究发现 GA 对于所考虑的所有情况都表现得非常好,而 SQP 虽然是一种计算效率更高的方法,但由于局部极小值捕获,在两种误差函数选择方面受到一定限制。
In this paper, two separate techniques, i.e., sequential quadratic programming (SQP) and a genetic algorithm (GA), were used to estimate the complex permittivity of each layer in a multilayer composite structure. The relative performance of the algorithms was characterized by applying each algorithm to one of three different error functions. Computer generated S-parameter data sets were initially used in order to establish the achievable accuracy of each algorithm. Based on these data sets and S-parameter measurements of single and multilayer samples obtained using a standard X-band waveguide procedure, the GA was determined to be the more robust algorithm in terms of minimizing rms error of measured/generated and formulated S-parameters. The GA was found to perform exceptionally well for all cases considered, whereas SQP, although a more computationally efficient method, was somewhat limited for two error function choices due to local minima trapping.