The Secondary Electron Emission Yield for 24 Solid Elements Excited by Primary Electrons in the Range 250-5000 ev: A Theory/Experiment Comparison
The Secondary Electron Emission Yield for 24 Solid Elements Excited by Primary Electrons in the Range 250-5000 ev: A Theory/Experiment Comparison
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DOI：
10.1002/sca.20124
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发表时间：
2008-09-01
期刊：
影响因子：
--
通讯作者：
Zadrazil, M.
中科院分区：
文献类型：
--
作者：
Walker, C. G. H.;El-Gomati, M. M.;Zadrazil, M.
二次电子 (SE) 产额为 6，是在低主束能量 (250-5,000 eV) 下从 24 种不同元素测得的。表面污染影响 (5 的强度，但不影响其随初级电子能量的变化。实验表明，SE 的平均自由程在过渡金属的 d 带上变化，与理论一致。蒙特卡洛模拟表明，可能需要包括表面等离子体激元，以提高与实验的一致性。扫描 30: 365-380, 2008。(C) 2008 Wiley periodicals, Inc.
The secondary electron (SE) yield, 6, was measured from 24 different elements at low primary beam energy (250-5,000 eV). Surface contamination affects the intensity of (5 but not its variation with primary electron energy. The experiments suggest that the mean free path of SEs varies across the d bands of transition metals in agreement with theory. Monte Carlo simulations suggest that surface plasmons may need to be included for improved agreement with experiment. SCANNING 30: 365-380, 2008. (C) 2008 Wiley Periodicals, Inc.