ESR Measurements of HOPG Irradiated with Highly Charged Ions
ESR Measurements of HOPG Irradiated with Highly Charged Ions
复制标题
高电荷离子辐照 HOPG 的 ESR 测量
DOI：
10.1380/ejssnt.2018.356
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发表时间：
2018
影响因子：
0.7
通讯作者：
S. Honda
中科院分区：
文献类型：
--
作者：
N. Nishida;Koji Betsumiya;M. Sakurai;T. Sakurai;T. Terui;S. Honda
用电子自旋共振（ESR）方法研究了高电荷态离子（HCI）辐照高取向热解石墨（HOPG）样品的ESR谱。HCI与表面之间的相互作用导致在可见光至X射线范围内的光子发射、数百个二次电子、二次离子溅射和纳米尺度的表面结构改性。在本实验中，通过电子束离子源（EBIS）产生HCI，并使用Ar和Ar进行照射。ESR测量提供关于样品的未成对电子的信息。利用ESR研究了缺陷形成与电荷态和入射HCI能量密度的关系。在低温区，HOPG样品经HCl辐照后出现L1谱线，且在高电荷态和高注量下强度变大。[DOI：10.1380/ejssnt.2018.356]
Electron spin resonance (ESR) measurements were performed on highly oriented pyrolytic graphite (HOPG) samples irradiated with highly charged ions (HCIs). The interaction between a HCI and surfaces results in emission of photons in the range of visible to X-ray, hundreds of secondary electrons, sputtering of secondary ions and modification of surface structure in nanometer scale. In the present experiments, HCIs were produced by electron beam ion source (EBIS) and Ar and Ar were used for the irradiation. ESR measurement provides information on unpaired electrons of the sample. We investigated the dependence of defect formation on charge state and fluence of incident HCIs using ESR. The L1 line appeared in HOPG samples irradiated with HCIs at the low temperature region, and the intensity became larger at higher charge state and higher fluence. [DOI: 10.1380/ejssnt.2018.356]