Local Impedance Measurement by Direct Detection of Oscillating Electrostatic Potential Using Kelvin Probe Force Microscopy
Local Impedance Measurement by Direct Detection of Oscillating Electrostatic Potential Using Kelvin Probe Force Microscopy
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DOI：
10.1021/acs.jpcc.2c05567
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发表时间：
2022-10
期刊：
影响因子：
--
通讯作者：
N. Ishida
中科院分区：
文献类型：
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作者：
N. Ishida
阻抗谱（IS）在评估材料和器件中载流子随时间变化的行为方面发挥着独特的作用。然而，缺乏空间位置的信息往往阻碍了结果的准确解释。在这项研究中，我们开发了一种测量局部阻抗分布的方法，可以弥补这一缺点。实验结果与数值模拟和宏观IS数据的比较验证了测量的有效性。我们证明，这种方法是能够定位阻抗组件在IS数据和测量其长度尺度具有高的空间分辨率。这种方法补充了从宏观IS测量获得的信息，从而有助于全面了解在不同的时间尺度上的技术上重要的材料和设备的载流子行为。
Impedance spectroscopy (IS) plays a unique role in evaluating time-dependent behavior of carriers in materials and devices. However, lack of information on spatial locations often hinders the accurate interpretation of results. In this study, we develop a method for measuring the local impedance distribution that can compensate for this disadvantage. The validity of the measurement was verified by comparing the experimental results with numerical simulation and macroscopic IS data. We demonstrated that this method was able to locate impedance components in IS data and measure their length scales with a high spatial resolution. This method complements the information obtained from macroscopic IS measurements and thus contributes to a comprehensive understanding of the carrier behavior at different time scales in technologically important materials and devices.