Simultaneous atomic-resolution flexural and torsional imaging in liquid by frequency modulation atomic force microscopy

Simultaneous atomic-resolution flexural and torsional imaging in liquid by frequency modulation atomic force microscopy
复制标题

DOI:
10.35848/1347-4065/ab7479
复制
发表时间:
2020-06-01
影响因子:
1.5
通讯作者:
Kobayashi, Naritaka
Kobayashi, Naritaka
中科院分区:
物理与天体物理4区
文献类型:
--
作者:
Umemoto, Megumi;Kawamura, Ryuzo;Kobayashi, Naritaka

文献摘要

被引文献

相似文献

液-环境调频原子力显微镜(FM-AFM)是一种强大的纳米工具,可以在原子尺度上研究发生在固-液界面上的现象。为了扩展其功能,我们开发了同时检测液体中垂直和横向尖端-样品相互作用力的FM-AFM系统。由于使用垂直力作为z反馈信号来调节针尖-样品距离,我们成功地在针尖与样品表面完全接触的情况下稳定地检测了横向力。这使得在液体中同时进行原子分辨率的弯曲和扭转成像成为可能。我们证明了扭转图像与传统的地形(弯曲)图像呈现不同的对比模式,强调了最上面表面的特定结构,如突出的原子。(C) 2020日本应用物理学会
Liquid-environment frequency modulation atomic force microscopy (FM-AFM) is a powerful nanotool that can investigate phenomena occurring at solid-liquid interfaces in atomic-scale. To extend its function, we have developed FM-AFM system for simultaneous detection of vertical and lateral tip-sample interaction forces in liquid. Owing to tip-sample distance regulation by using a vertical force as a z-feedback signal, we succeeded in detecting a lateral force stably without full contact of a tip to a sample surface. This enabled simultaneous atomic-resolution flexural and torsional imaging in liquid. We demonstrated that the torsional images, which show different contrast pattern with that of the conventional topographic (flexural) images, emphasize specific structures of the topmost surface such as protruding atoms. (C) 2020 The Japan Society of Applied Physics