Simultaneous atomic-resolution flexural and torsional imaging in liquid by frequency modulation atomic force microscopy
Simultaneous atomic-resolution flexural and torsional imaging in liquid by frequency modulation atomic force microscopy
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DOI:
10.35848/1347-4065/ab7479
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发表时间:
2020-06-01
影响因子:
1.5
通讯作者:
Kobayashi, Naritaka
中科院分区:
文献类型:
--
作者:
Umemoto, Megumi;Kawamura, Ryuzo;Kobayashi, Naritaka
Liquid-environment frequency modulation atomic force microscopy (FM-AFM) is a powerful nanotool that can investigate phenomena occurring at solid-liquid interfaces in atomic-scale. To extend its function, we have developed FM-AFM system for simultaneous detection of vertical and lateral tip-sample interaction forces in liquid. Owing to tip-sample distance regulation by using a vertical force as a z-feedback signal, we succeeded in detecting a lateral force stably without full contact of a tip to a sample surface. This enabled simultaneous atomic-resolution flexural and torsional imaging in liquid. We demonstrated that the torsional images, which show different contrast pattern with that of the conventional topographic (flexural) images, emphasize specific structures of the topmost surface such as protruding atoms. (C) 2020 The Japan Society of Applied Physics