Shear-mode magnetic force microscopy with a quartz tuning fork in ambient conditions
Shear-mode magnetic force microscopy with a quartz tuning fork in ambient conditions
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DOI：
10.1088/0957-4484/17/7/s17
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发表时间：
2006-04-14
期刊：
影响因子：
3.5
通讯作者：
Jhe, W
中科院分区：
文献类型：
--
作者：
Kim, K;Seo, Y;Jhe, W
我们已经证明了高分辨率的剪切模式磁力显微镜（MFM）使用石英音叉在环境条件下。一个商业磁性悬臂梁尖端连接到音叉的一个叉实现剪切模式MFM操作。我们已经获得了MFM图像的空间分辨率小于100 nm，并表现出类似于1兆赫的频率分辨率，这是通过相移检测方法实现的值。
We have demonstrated high-resolution shear-mode magnetic force microscopy (MFM) using a quartz tuning fork in ambient conditions. A commercial magnetic cantilever tip was attached to one prong of the tuning fork to realize shear-mode MFM operation. We have obtained MFM images with a spatial resolution of less than 100 nm and demonstrated a frequency resolution of similar to 1 mHz, values which are achieved by phase shift detection methods.