A nanoindentation instrument for mechanical property measurement of 3D micro/nano-structured surfaces
A nanoindentation instrument for mechanical property measurement of 3D micro/nano-structured surfaces
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DOI:
10.1088/0957-0233/17/3/s06
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发表时间:
2006-03-01
影响因子:
2.4
通讯作者:
Ono, T
中科院分区:
文献类型:
--
作者:
Motoki, T;Gao, W;Ono, T
This paper presents a nanoindentation instrument for 3D micro/nano-structured surfaces made of soft metals Such as LSI circuit patterns. The instrument call carry Out indentations with hi-h resolution in both the vertical direction (Z) and lateral directions (XY). An electro-polished tungsten probe with a tip diameter of 100 nm is used as the indenter. The indentation motion along, the Z-direction is generated by a PZT actuator. The sample is mounted oil the free-end of a steel cantilever. The indentation depth and load can be accurately obtained from the PZT displacement, cantilever spring constant and the cantilever deflection measured by a capacitance-type displacement sensor. Nanoindentation experiments are carried Out oil an aluminium sample in the vacuum chamber of a scanning electronic microscope. Experimental results demonstrate that the instrument has the ability to perform nanoindentation.