Refractometric sensors based on microsphere resonators
Refractometric sensors based on microsphere resonators
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DOI：
10.1063/1.2132076
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发表时间：
2005-11-14
影响因子：
4
通讯作者：
Fan, XD
中科院分区：
文献类型：
--
作者：
Hanumegowda, NM;Stica, CJ;Fan, XD
我们研制了一种基于熔融石英微球谐振器的高灵敏度折射传感器。球体回音壁模的光谱位置随周围介质折射率的变化而发生变化。由于与WGM相关联的极高Q因子而产生的强烈的光-物质相互作用导致大约30 nm/RIU（折射率单位）的灵敏度。这与我们的传感器系统的高光谱分辨率（类似于0.01 pm）一起，产生了10（-7）RIU量级的折射率变化的检测限。理论计算结果与实验数据吻合较好。(C)2005年美国物理学会。
We have developed a highly sensitive refractometric sensor based on fused silica microsphere resonators. The spectral position of the whispering gallery mode (WGM) of a sphere shifts in response to the refractive index change in the surrounding medium. The strong light-matter interaction due to the extremely high Q factor associated with the WGM results in a sensitivity of approximately 30 nm/RIU (refractive index units). This, together with the high spectral resolution of our sensor system (similar to 0.01 pm), yields a detection limit of refractive index change on the order of 10(-7) RIU. Theoretical calculation is also performed and agrees well with the experimental data. (C) 2005 American Institute of Physics.