Mapping quantitative trait loci for disease resistance to false smut of rice
Mapping quantitative trait loci for disease resistance to false smut of rice
复制标题
水稻抗黑穗病数量性状基因座定位
DOI:
10.1186/s42483-020-00059-6
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发表时间:
2020-07-30
影响因子:
3.4
通讯作者:
Sun, Wenxian
中科院分区:
文献类型:
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作者:
Han, Yanqing;Li, Deqiang;Sun, Wenxian
False smut of rice, an important emerging disease caused byUstilaginoidea virens, greatly reduces grain yield and deteriorates grain quality in many rice-growing regions worldwide. Identification of quantitative trait loci (QTL) conferring false smut resistance will facilitate incorporation of false smut resistance into elite cultivars. In this study, a set of recombinant inbred lines (RILs) derived from a cross of a resistant rice landrace MR183–2 and a high susceptible line 08R2394 were evaluated to map resistance QTLs for false smut. A total of 179 simple sequence repeat (SSR) polymorphic markers were identified for constructing genetic linkage maps. Using a composite interval mapping method, five false smut resistance QTLs were detected on chromosomes 2, 4, 8 and 11 in the RIL population. Among these QTLs,qFsr8–1within a small region on chromosome 8 represents a major quantitative locus explaining the greatest phenotypic variance. Gene annotation in this major QTL region provides a theoretical basis for cloning of resistance QTLs. The SSR markers genetically linked toqFsr8–1are valuable for marker-assisted breeding for false smut resistance in rice. In addition, nine QTLs for heading date were detected in this population. Correlation analysis of disease resistance score and heading date indicates that false smut resistance negatively correlates with the growth period length in rice.