Cluster primary ion bombardment of organic materials
Cluster primary ion bombardment of organic materials
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DOI：
10.1016/j.apsusc.2004.03.101
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发表时间：
2004-06-15
影响因子：
6.7
通讯作者：
Kollmer, F
中科院分区：
文献类型：
--
作者：
Kollmer, F
为了评估它们的分子表面分析的潜力，我们应用单原子（Ga，Cs，An，Bi）以及多原子（SF 5，Au-n，Bi-n，C-60）的初级离子的一系列有机样品。对于在LDPE上的模型系统Irganox 1010，我们确定了二次离子产率、消失截面和作为一次离子能量的函数的所得离子形成效率。作为一般结果，效率随着单原子初级离子的质量而提高。通过使用多原子初级离子获得了进一步的增加。据此，C-60的效率最高，Ga的效率最低。此外，对真实的世界样品（电子元件、药物）进行分子成像：为此应用了用Ga、AuGe或Bi操作的簇LMIS。结果表明，集群西姆斯的潜力，以克服现有的局限性，并建立TOF-SIMS在聚合物，生物和医学领域的新应用。(C)2004 Elsevier B. V.保留所有权利。
In order to evaluate their potential for molecular surface analysis, we applied monoatomic (Ga, Cs, An, Bi) as well as polyatomic (SF5, Au-n, Bi-n, C-60) primary ions to a series of organic samples. For the model system Irganox 1010 on LDPE we determined the secondary ion yield, the disappearance cross section and the resulting ion formation efficiency as a function of the primary ion energy. As a general result the efficiency is improved with the mass of the monoatomic primary ion. A further increase is obtained by the use of polyatomic primary ions. According to this, highest efficiencies are obtained for C-60, the lowest for Ga. Additionally, molecular imaging was performed on real world samples (electronic components, pharmaceuticals): for this a cluster LMIS operated with Ga, AuGe or Bi was applied. The results reveal the potential of cluster SIMS to overcome existing limitations and to establish TOF-SIMS for new applications in the fields of polymers, biology and medicine. (C) 2004 Elsevier B.V. All rights reserved.