Non-invasive imaging of stem cells by scanning ion conductance microscopy: future perspective.
Non-invasive imaging of stem cells by scanning ion conductance microscopy: future perspective.
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DOI：
10.1089/ten.tec.2008.0058
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发表时间：
2008-12
影响因子：
3
通讯作者：
Korchev, Yuri E.
中科院分区：
文献类型：
--
作者：
Gorelik, Julia;Ali, Nadire N.;Kadir, Siti H. Sheikh Abdul;Lab, Max;Stojkovic, Petra;Armstrong, Lyle;Sviderskaya, Elena V.;Negulyaev, Yuri A.;Klenerman, David;Bennett, Dorothy C.;Lako, Majlinda;Harding, Sian E.;Stojkovic, Miodrag;Korchev, Yuri E.
干细胞（SCs）最有价值的特性是它们有可能分化成人体的许多或所有细胞类型。到目前为止，只有在样品制备过程中固定或破坏细胞后才能监测SC分化。然而，开发非破坏性的SCs监测方法是很重要的。扫描离子电导显微镜（SICM）是一种独特的成像技术，使用与原子力显微镜相似的原理，但使用移液器作为探针。这使得对活细胞表面的无创扫描成为可能，并且与其他高分辨率显微镜技术相比，能够在更多生理条件下测量细胞活动。我们在此报告了SICM用于研究sc的新应用，以评估和监测sc和从sc分化的各种细胞类型的状态。
The most valuable property of stem cells (SCs) is their potential to differentiate into many or all cell types of the body. So far, monitoring SC differentiation has only been possible after cells were fixed or destroyed during sample preparation. It is, however, important to develop nondestructive methods of monitoring SCs. Scanning ion conductance microscopy (SICM) is a unique imaging technique that uses similar principles to the atomic force microscope, but with a pipette for the probe. This allows scanning of the surface of living cells noninvasively and enables measurement of cellular activities under more physiological conditions than is possible with other high-resolution microscopy techniques. We report here the novel use of the SICM for studying SCs to assess and monitor the status of SCs and various cell types differentiated from SCs.
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影响因子：
5.2
作者：
Hyslop, L;Stojkovic, M;Lako, M
通讯作者：
Lako, M
影响因子：
5.2
作者：
Krtolica, Ana;Genbacev, Olga;Fisher, Susan J.
通讯作者：
Fisher, Susan J.
影响因子：
2.5
作者：
Todorovic, SM;Lingle, CJ
通讯作者：
Lingle, CJ
影响因子：
3.2
作者：
Cui, L;Johkura, K;Sasaki, K
通讯作者：
Sasaki, K
影响因子：
3.4
作者：
Gorelik, J;Gu, YC;Korchev, YE
通讯作者：
Korchev, YE