The effect of crystallographic misorientation and interfacial separation on jump-to-contact behavior and defect generation in aluminum
The effect of crystallographic misorientation and interfacial separation on jump-to-contact behavior and defect generation in aluminum
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DOI:
10.1088/1361-651x/aac427
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发表时间:
2018-05
影响因子:
1.8
通讯作者:
Milad Khajehvand;Panthea Sepehrband
中科院分区:
文献类型:
--
作者:
Milad Khajehvand;Panthea Sepehrband
The jump-to-contact (JC) phenomenon for (111)-oriented surfaces in aluminum at room temperature is studied via molecular dynamics simulations. The effect of crystallographic misorientation and interfacial distance on the JC behavior and distribution of the resultant defects at the interface is investigated. The effect of misorientation on the critical distance for JC is found to be negligible. However, when JC occurs, different distribution of defects is observed for various misorientation angles. The density of defects is shown to be a function of interfacial distance for low misorientation angles, but independent of it for misorientation angles of ∼30 ± 10°.