Crystallization kinetics and thermodynamics of an Ag–In–Sb–Te phase change material using complementary in situ microscopic techniques
Crystallization kinetics and thermodynamics of an Ag–In–Sb–Te phase change material using complementary in situ microscopic techniques
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DOI：
10.1557/s43578-022-00486-5
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发表时间：
2022-03
影响因子：
2.7
通讯作者：
Isak McGieson;Victoriea L. Bird;C. Barr;K. Hattar;B. Reed;J. McKeown;F. Yi;D. Laván;M. Santala
中科院分区：
文献类型：
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作者：
Isak McGieson;Victoriea L. Bird;C. Barr;K. Hattar;B. Reed;J. McKeown;F. Yi;D. Laván;M. Santala
采用多种原位成像技术研究了非晶Ag-In-Sb-Te（AIST）相变材料（PCM）的结晶，以直接量化晶体生长速率在很宽的温度范围内。可测量的增长率范围从100 -9到200米/秒。最近的结果使用动态透射电子显微镜（TEM），光电子发射TEM技术，和TEM与子帧成像在这里报道，并放置到AIST上以前的生长速率测量的上下文中。动态TEM实验表明，所观察到的沉积膜的最大晶体生长速率为> 20 m/s。它示出了以上的玻璃化转变的晶体生长可以通过使用子帧和高帧速率的直接电子检测相机在TEM中成像。与确定在原位TEM实验过程中的温度的挑战进行了描述。初步nanocalorimetry的结果表明，收集热力学数据的PCM结晶与同步TEM成像的可行性。
The crystallization of an amorphous Ag–In–Sb–Te (AIST) phase change material (PCM) is studied using multiple in situ imaging techniques to directly quantify crystal growth rates over a broad range of temperatures. The measurable growth rates span from ≈ 10–9 to ≈ 20 m/s. Recent results using dynamic transmission electron microscopy (TEM), a photoemission TEM technique, and TEM with sub-framed imaging are reported here and placed into the context of previous growth rate measurements on AIST. Dynamic TEM experiments show a maximum observed crystal growth rate for as-deposited films to be > 20 m/s. It is shown that crystal growth above the glass transition can be imaged in a TEM through use of subframing and a high-frame-rate direct electron detection camera. Challenges associated with the determination of temperature during in situ TEM experiments are described. Preliminary nanocalorimetry results demonstrate the feasibility of collecting thermodynamic data for crystallization of PCMs with simultaneous TEM imaging.