Observation of laser-assisted Auger decay in argon.
Observation of laser-assisted Auger decay in argon.
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DOI：
10.1103/physrevlett.73.2180
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发表时间：
1994-10
影响因子：
8.6
通讯作者：
J. Schins;P. Breger;P. Agostini;R. Constantinescu;H. Muller;G. Grillon;A. Antonetti;A. Mysyrowicz
中科院分区：
文献类型：
--
作者：
J. Schins;P. Breger;P. Agostini;R. Constantinescu;H. Muller;G. Grillon;A. Antonetti;A. Mysyrowicz
利用电子能谱研究了强修整场对俄歇过程中电子能量的影响。放大的Ti：S激光器提供范围从150飞秒到8皮秒的40 mJ的红外（800 nm）脉冲。[1]部分红外光束聚焦在液态金属（镓）靶上，产生宽带X射线辐射。在飞行时间电子能谱仪中检测到氩气中X诱导LMM跃迁产生的俄歇电子[2]。当X射线束和红外敷料束在空间和时间上重叠时，边带出现在俄歇峰周围，对应于来自敷料场的光子的吸收或发射。
We investigated the effect of an intense dressing field on the energies of electrons ejected in an Auger process by means of electron spectroscopy. An amplified Ti:S laser provides infrared (800 nm) pulses of 40 mJ ranging from 150 femtoseconds to 8 picoseconds.[1] Part of the infrared beam is focused onto a liquid metal (gallium) target to produce broadband X-radiation. Auger electrons resulting from the X-induced LMM transition in argon[2] are detected in a time-of-flight electron spectrometer. When the X-ray beam and the infrared dressing beam overlap in space and time, sidebands appear around the Auger peaks, corresponding to absorption or emission of photons from the dressing field.