Growth and characterization of tetragonal bismuth ferrite–lead titanate thin films
Growth and characterization of tetragonal bismuth ferrite–lead titanate thin films
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DOI：
10.1016/j.actamat.2008.01.008
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发表时间：
2008-05
期刊：
影响因子：
9.4
通讯作者：
Mikael A. Khan;T. Comyn;A. Bell
中科院分区：
文献类型：
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作者：
Mikael A. Khan;T. Comyn;A. Bell
采用脉冲激光沉积技术制备了x=0.9~0.7的四方铋铁氧体-钛酸铅(1−x)BiFeO_3-xPbTiO_3薄膜。薄膜呈致密的柱状晶生长。X射线衍射分析表明，薄膜具有钙钛矿结构，并具有择优的(111)织构。用扫描电子显微镜研究了薄膜的微观结构。用极化磁滞行为和阻抗谱讨论了薄膜的铁电性质。在场强为500kVcm∼-1和∼-10°C时，薄膜的剩余偏振值在2PR-μ-45-−-60−-−之间，在频率为2 kHz时介电常数在375-1096之间。
Thin films of tetragonal bismuth ferrite–lead titanate (1−x)BiFeO3–xPbTiO3with x=0.9–0.7 were prepared by pulsed laser deposition (PLD). The films exhibit a dense columnar grain growth. XRD analysis reveals that the films have a perovskite structure and exhibit a preferred (111) texture. The film microstructure was studied using SEM. The ferroelectric properties of the films are discussed in the light of polarization-field hysteresis behaviour and impedance spectroscopy. The remanent polarization values ranged between 2Pr∼45 and ∼60μCcm−2at a field amplitude of 500kVcm−1and −10°C, while the dielectric permittivity of the films ranged between 375 and 1096 at a frequency of 2kHz.