Common-Mode EMI Unterminated Behavioral Model of Wide-Bandgap-Based Power Converters Operating at High Switching Frequency

Common-Mode EMI Unterminated Behavioral Model of Wide-Bandgap-Based Power Converters Operating at High Switching Frequency
复制标题

高开关频率下工作的宽带隙电源转换器的共模 EMI 未端接行为模型

DOI:
--
复制
发表时间:
2019
影响因子:
5.5
通讯作者:
D. Boroyevich
D. Boroyevich
中科院分区:
工程技术1区
文献类型:
--
作者:
Bingyao Sun;R. Burgos;D. Boroyevich

文献摘要

被引文献

相似文献

随着宽带隙半导体的商用,高开关频率操作已成为一种公认的做法,以提高功率转换器的功率密度。然而,高开关频率操作会增加转换器的电磁干扰(EMI)发射,因此需要精确的模型来预测其EMI噪声并帮助设计必要的滤波器。为此,本文首先分析了高开关频率对变换器EMI发射的影响,其次,使用无端接行为模型(UBM)预测了传导EMI范围(150 kHz-30 MHz)内的共模(CM)发射。为了实现这一目标,研究人员为UBM开发了一种新的提取程序,以有效地捕获CM发射的丰富高频内容,为先前为基于绝缘栅双极晶体管的变换器开发的行为模型的固有局限性提供了解决方案。实验结果表明,在70khz频率下,3kw、300v直流、基于碳化硅的三相逆变器开关和500khz频率下,1kw、400v直流、基于氮化镓的三相逆变器开关,验证了该方法和模型的能力。
With wide-bandgap semiconductors increasing their commercial availability, high switching frequency operation has become an accepted practice to increase power density in power converters. High switching frequency operation, nonetheless, increases the electromagnetic interference (EMI) emissions of converters, for which accurate models are needed in order to predict their EMI noise and aid in the design of necessary filters. To this end, this paper assays first the impact that high switching frequency has on converter EMI emissions, and second, uses an unterminated behavioral model (UBM) to predict the common-mode (CM) emissions in the conducted EMI range (150 kHz–30 MHz). To achieve this, a new extraction procedure is developed for a UBM to effectively capture the rich high-frequency content of the CM emissions, providing a solution to the inherent limitations of previous behavioral models developed for insulated-gate bipolar transistor-based converters. The experimental results obtained with two setups: a 3-kW, 300-V dc, silicon-carbide-based three-phase inverter switching at 70 kHz and a 1-kW, 400-V dc, gallium nitride -based three-phase inverter switching at 500 kHz are presented to validate the approach and the model capabilities.