X-RAY STRUCTURAL STUDIES OF FERROELECTRIC LIQUID CRYSTAL DEVICES

X-RAY STRUCTURAL STUDIES OF FERROELECTRIC LIQUID CRYSTAL DEVICES
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铁电液晶器件的 X 射线结构研究

DOI：
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发表时间：
2003
期刊：
影响因子：
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通讯作者：
R. Richardson
R. Richardson
中科院分区：
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文献类型：
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作者：
C. Brown;Paul E. Dunn;J. C. Jones;S. Jenkins;R. Richardson

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被引文献

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来自装置状单元中的近晶材料的X射线衍射用于确定单元内的层结构。实验方法确定近晶层正常取向分布作为细胞内的倾斜和扭转角的函数。在层法线不扭曲远离对准方向的特殊情况下，人字形结构已从分布重建。由于取向层，电场和倾斜的取向层的表面预倾斜的近晶层的正常分布的影响进行了审查和讨论。
X-ray diffraction from smectic materials in device-like cells is used to determine the layer structure within the cells. The experimental method determines the smectic layer normal orientational distribution as a function of tilt and twist angles within the cell. In a special case where the layer normals are not twisted away from the alignment direction, the chevron structures have been reconstructed from the distributions. The influence of the surface pre-tilt due to the alignment layer, electric fields and skewed alignment layers on the smectic layer normal distributions are reviewed and discussed.