Thermal conduction in thin films measured by optical surface thermal lensing
Thermal conduction in thin films measured by optical surface thermal lensing
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DOI：
10.1063/1.3490185
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发表时间：
2010-10-01
影响因子：
3.2
通讯作者：
Hache, Alain
中科院分区：
文献类型：
--
作者：
Bourgoin, Jean-Philippe;Allogho, Guy-Germain;Hache, Alain
利用表面热透镜效应对薄膜的热传导进行了光学测量。泵浦-探测激光测量结合数值模拟用于研究薄至10 nm的各种材料中的热传导。该方法相对简单、稳健、快速，并提供了当前技术的替代方案。当金膜厚度从2000 nm减小到100 nm时，金膜的热导率从300 W/Km下降到100 W/Km。银，锡和铝膜的结果也被提出，并与其他研究的结果进行比较。(C)2010年美国物理学会。[doi：10.1063/1.3490185]
Thermal conduction across thin films is measured optically by using the surface thermal lensing effect. Pump-probe laser measurements combined with numerical modeling are used to study thermal conduction in a variety of materials as thin as 10 nm. The method is relatively simple, robust, rapid, and offers an alternative to current techniques. Thermal conductivity in gold films is found to drop from 300 to 100 W/Km when the film thickness is reduced from 2000 to 100 nm. Results for silver, tin and aluminum films are also presented and compared with results from other studies. (C) 2010 American Institute of Physics. [doi:10.1063/1.3490185]