CAPTURE AND EMISSION KINETICS OF INDIVIDUAL SI-SIO2 INTERFACE STATE S
CAPTURE AND EMISSION KINETICS OF INDIVIDUAL SI-SIO2 INTERFACE STATE S
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DOI:
10.1063/1.97000
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发表时间:
1986-05-12
影响因子:
4
通讯作者:
UREN, MJ
中科院分区:
文献类型:
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作者:
KIRTON, MJ;UREN, MJ