miniPixD: a compact sample analysis system which combines X-ray imaging and diffraction

miniPixD: a compact sample analysis system which combines X-ray imaging and diffraction
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DOI:
10.1088/1748-0221/12/02/p02001
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发表时间:
2017-02-01
影响因子:
1.3
通讯作者:
Speller, Robert
Speller, Robert
中科院分区:
工程技术4区
文献类型:
--
作者:
Moss, Robert;Crews, Chiaki;Speller, Robert

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本文介绍了 miniPixD:一种新型紧凑系统,利用透射 X 射线成像和 X 射线衍射 (XRD) 来定位和识别不透明体积内的感兴趣材料。该系统和所体现的技术可用于安全检查、医疗诊断、无损检测(NDT)和质量保证(QA)。本文概述了系统的设计,包括对组件选择的讨论,并提供了相关样品的一些数据,并与其他能量色散和角色散 XRD 技术进行了比较。
This paper introduces miniPixD: a new, compact system that utilises transmission X-ray imaging and X-ray diffraction (XRD) to locate and identify materials of interest within an otherwise opaque volume. The system and the embodied techniques have utility in security screening, medical diagnostics, non-destructive testing (NDT) and quality assurance (QA). This paper outlines the design of the system including discussion on the choice of components and presents some data from relevant samples which are compared to other energy dispersive and angular dispersive XRD techniques.