Transparent scan: a new approach to test generation and test compaction for scan circuits that incorporates limited scan operations
Transparent scan: a new approach to test generation and test compaction for scan circuits that incorporates limited scan operations
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透明扫描：一种测试生成和测试压缩扫描电路的新方法，包含有限的扫描操作
DOI：
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发表时间：
2003
期刊：
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通讯作者：
S. Reddy
中科院分区：
文献类型：
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作者：
I. Pomeranz;S. Reddy
我们描述了一种测试扫描电路的生成和测试压缩的新方法，该方法消除了扫描操作和主输入向量的应用之间的区别。在这种方法下，扫描输入、扫描选择和扫描输出线被视为电路的传统主输入或主输出。因此，有限的扫描操作（其中扫描链的移位次数小于其长度）自然地合并到由该方法生成的测试序列中。这导致非常积极的压缩，从而导致基准电路的测试序列具有已知的最低测试应用时间。可以使用支持有限扫描操作的传统测试应用方案来应用所得到的测试序列。
We describe a new approach to test generation and test compaction for scan circuits that eliminates the distinction between scan operations and application of primary input vectors. Under this approach, the scan-in, scan-select, and scan-out lines are treated as conventional primary inputs or primary outputs of the circuit. As a result, limited scan operations, where scan chains are shifted a number of times smaller than their lengths, are incorporated naturally into the test sequences generated by this approach. This leads to very aggressive compaction, resulting in test sequences with the lowest known test application times for benchmark circuits. The resulting test sequences can be applied using conventional test application schemes that support limited scan operations.