Diameter dependence of the electronic structure of ZnO nanorods determined by x-ray absorption spectroscopy and scanning photoelectron microscopy
Diameter dependence of the electronic structure of ZnO nanorods determined by x-ray absorption spectroscopy and scanning photoelectron microscopy
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DOI：
10.1063/1.1802373
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发表时间：
2004-10-11
影响因子：
4
通讯作者：
Liu, SC
中科院分区：
文献类型：
--
作者：
Chiou, JW;Kumar, KPK;Liu, SC
对不同直径的氧化锌纳米棒进行了X射线吸收近边结构(XANES)谱和扫描光电子显微镜(SPEM)谱的研究。XANES谱分析表明，随着纳米棒尺寸的减小，O2p和Zn4p空态数目增加，这反映了随着纳米棒直径的减小，表面态的增强。价带光电子能谱表明，直径为45 nm的纳米棒的价带明显变窄。与氧化锌参照膜相比，所有纳米棒的3DSPEM谱中的3D峰强度都大大降低，这可以解释为巡回终态密度的降低或跃迁几率的降低。(C)2004年美国物理研究所。
O K-, ZnL3, and K-edges x-ray absorption near-edge structure (XANES) spectra and scanning photoelectron microscopy (SPEM) spectra were obtained for ZnO nanorods with various diameters. The analysis of the XANES spectra revealed increased numbers of O 2p and Zn 4p unoccupied states with the downsizing of the nanorods which reflects the enhancement of surface states when the diameter is decreased. Valence-band photoemission spectra show a significant narrowing of the valence band for the 45 nm diameter nanorod. The Zn 3d intensities in the Zn 3d SPEM spectra are drastically diminished for all nanorods as compared to the ZnO reference film, which can be interpreted as a reduction in density of itinerant final states or in transition probability. (C) 2004 American Institute of Physics.