Application of scanning probe microscopy to the characterization and fabrication of hybrid nanomaterials
Application of scanning probe microscopy to the characterization and fabrication of hybrid nanomaterials
复制标题
DOI：
10.1002/jemt.20100
复制
发表时间：
2004-08
影响因子：
2.5
通讯作者：
M. Greene;C. Kinser;D. Kramer;L. Pingree;M. Hersam
中科院分区：
文献类型：
--
作者：
M. Greene;C. Kinser;D. Kramer;L. Pingree;M. Hersam
扫描探针显微镜（SPM）是一种广泛使用的实验技术，用于表征和制造表面上的纳米结构。特别是，由于其能够以纳米空间分辨率空间映射材料特性的变化，SPM特别适合于探测混合纳米材料的子组分和界面，即，这些材料由具有可区分特性的不同纳米级组分组成。此外，SPM尖端与材料的相互作用可以被有意地调整，使得实现局部表面改性。以这种方式，也可以使用SPM在固体基底上制造混合纳米结构。这份报告回顾了最近的发展，在表征和制造的混合纳米材料与SPM。特别注意的是纳米材料，包括有机和无机成分，包括安装在无机基板上的单个生物分子。SPM技术是特别适合于表征的机械和电气性能的这种混合动力系统在大气压环境中的突出显示，并提供具体的说明性例子。本次审查结束时，简要讨论了剩余的挑战和充满希望的未来前景，这一领域。Microsc. Res. Tech. 64：415-434，2004.© 2004 Wiley利斯公司
Scanning probe microscopy (SPM) is a widely used experimental technique for characterizing and fabricating nanostructures on surfaces. In particular, due to its ability to spatially map variations in materials properties with nanometer spatial resolution, SPM is particularly well suited to probe the subcomponents and interfaces of hybrid nanomaterials, i.e., materials that are made up of distinct nanometer scale components with distinguishable properties. In addition, the interaction of the SPM tip with materials can be intentionally tuned such that local surface modification is achieved. In this manner, hybrid nanostructures can also be fabricated on solid substrates using SPM. This report reviews recent developments in the characterization and fabrication of hybrid nanomaterials with SPM. Specific attention is given to nanomaterials that consist of both organic and inorganic components including individual biomolecules mounted on inorganic substrates. SPM techniques that are particularly well suited for characterizing the mechanical and electrical properties of such hybrid systems in atmospheric pressure environments are highlighted, and specific illustrative examples are provided. This review concludes with a brief discussion of the remaining challenges and promising future prospects for this field. Microsc. Res. Tech. 64:415–434, 2004. © 2004 Wiley‐Liss, Inc.