Comparative study of surface morphology of copper phthalocyanine ultra thin films deposited on Si (111) native and RCA-cleaned substrates
Comparative study of surface morphology of copper phthalocyanine ultra thin films deposited on Si (111) native and RCA-cleaned substrates
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DOI:
10.1016/j.tsf.2012.01.018
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发表时间:
2012-03
期刊:
影响因子:
2.1
通讯作者:
M. Krzywiecki;L. Grządziel;J. Bodzenta;J. Szuber
中科院分区:
文献类型:
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作者:
M. Krzywiecki;L. Grządziel;J. Bodzenta;J. Szuber