Quantification of irradiation-induced defects in UO2 using Raman and positron annihilation spectroscopies
Quantification of irradiation-induced defects in UO2 using Raman and positron annihilation spectroscopies
复制标题
使用拉曼和正电子湮灭光谱对 UO2 中辐照引起的缺陷进行定量
作者:
R. Mohun;L. Desgranges;C. Jegou;B. Boizot;O. Cavani;A. Canizarès;F. Duval;C. He;P. Desgardin;M. Barthe;P. Simon