Dissipative force modulation Kelvin probe force microscopy applying doubled frequency ac bias voltage
Dissipative force modulation Kelvin probe force microscopy applying doubled frequency ac bias voltage
复制标题
应用双频交流偏置电压的耗散力调制开尔文探针力显微镜
DOI：
10.1063/1.2432281
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发表时间：
2007
影响因子：
4
通讯作者：
Y. Sugawara
中科院分区：
文献类型：
--
作者：
H. Nomura;K. Kawasaki;T. Chikamoto;Y. Li;Y. Naitoh;M. Kageshima;Y. Sugawara
作者提出了一种使用耗散力调制 (DM) 方法的表面电势测量技术，该方法具有振荡悬臂梁的倍谐波频率 (2ω) 的交流偏置电压（2ωDM 方法）。在 2ωDM 方法中，悬臂和样品之间的杂散电容对静电力谱/开尔文探针力显微镜测量的影响几乎完全消除，因为调制静电力的距离依赖性从 1∕z 增加到 1∕z2。由于真空中悬臂梁的高品质因数，2ωDM 方法具有高力灵敏度的优点。作者通过使用耗散尖端-样品相互作用演示了定量表面电势测量。
The authors propose a surface potential measurement technique using dissipative force modulation (DM) method with an ac bias voltage of doubled harmonic frequency (2ω) of the oscillating cantilever (2ωDM method). The effect of the stray capacitance between a cantilever and a sample on electrostatic force spectroscopy/Kelvin probe force microscopy measurement is almost completely removed in 2ωDM method, since the distance dependence of the modulated electrostatic force increases from 1∕z to 1∕z2. 2ωDM method has an advantage of high force sensitivity due to the high Q factor of the cantilever in vacuum. The authors demonstrate quantitative surface potential measurement by using dissipative tip-sample interactions.