Impurity levels and bandedge electronic structure in as-grown arsenic-doped HgCdTe by infrared photoreflectance spectroscopy

Impurity levels and bandedge electronic structure in as-grown arsenic-doped HgCdTe by infrared photoreflectance spectroscopy
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通过红外光反射光谱研究生长的砷掺杂 HgCdTe 中的杂质水平和带边电子结构

DOI:
10.1103/physrevb.80.155125
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发表时间:
2009-10
期刊:
Physical Review B (IF=3.772)
影响因子:
--
通讯作者:
Jun Shao
Jun Shao
中科院分区:
其他
文献类型:
--
作者:
Shaoling Guo;Jianrong Yang;Lu Chen;Yanfeng Wei;Wei Lu;Li He;Xiang Lü;Junhao Chu;Jun Shao

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带隙电子结构的性质是掺砷窄禁带HgCdTe的一个重要的理论和技术问题。在这项研究中,我们进行了11-290K温度依赖的光反射PR测量
The nature of bandedge electronic structure represents a theoretically interesting and technologically important question in arsenic-doped narrow-gap HgCdTe. In this study, temperature-dependent 11–290 K photoreflectance PR measurements were carried out i