Note: Fast imaging of DNA in atomic force microscopy enabled by a local raster scan algorithm
Note: Fast imaging of DNA in atomic force microscopy enabled by a local raster scan algorithm
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DOI：
10.1063/1.4881682
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发表时间：
2014-06-01
影响因子：
1.6
通讯作者：
Andersson, Sean B.
中科院分区：
文献类型：
--
作者：
Huang, Peng;Andersson, Sean B.
高速原子力显微镜的方法通常涉及一些新的机械设计的组合来增加物理带宽和先进的控制器来最大限度地利用物理能力。然而，对于某些类别的样品，可以通过减少为样品成像而执行的测量量来减少在标准仪器上的成像时间。其中一种技术是局部栅格扫描算法，该算法是为对串状样本进行成像而开发的。在这里，我们提供了使用这种技术对DNA样本进行成像的实验结果，证明了该方案的有效性，并说明了它所提供的成像时间的数量级改进。(C)2014 AIP出版有限责任公司。
Approaches to high-speed atomic force microscopy typically involve some combination of novel mechanical design to increase the physical bandwidth and advanced controllers to take maximum advantage of the physical capabilities. For certain classes of samples, however, imaging time can be reduced on standard instruments by reducing the amount of measurement that is performed to image the sample. One such technique is the local raster scan algorithm, developed for imaging of string-like samples. Here we provide experimental results on the use of this technique to image DNA samples, demonstrating the efficacy of the scheme and illustrating the order-of-magnitude improvement in imaging time that it provides. (C) 2014 AIP Publishing LLC.