Characterization of an x-ray laser beam
Characterization of an x-ray laser beam
复制标题
X 射线激光束的表征
DOI：
10.1117/12.450599
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发表时间：
2001
期刊：
影响因子：
--
通讯作者：
D. Ros
中科院分区：
文献类型：
--
作者：
S. Le Pape;P. Zeitoun;J. Rocca;A. Carillon;P. Dhez;M. François;S. Hubert;M. Idir;D. Ros
在这篇文章中，我们报告的实验和数值工具，在LSAI开发的，一个完整的表征的X射线激光（XRL）束。首先，迈克尔逊干涉仪已被用来实现傅里叶变换光谱实验。一个完整的理解所测得的线宽需要在等离子体中的XRL光束放大的光线跟踪模拟的比较。本文给出了瞬态抽运XRL模拟结果。最后一节是专门描述的XUV夏克哈特曼波前传感器，我们已经开发，并研究毛细管放电XRL光束。
We report in this article the experimental and numerical tools, developed at the LSAI, for a complete characterization of an x-ray laser (XRL) beam. First, a Michelson interferometer has been used to realize a Fourrier transform spectroscopy experiment. A full comprehension of the measured linewidth requires a comparison of the XRL beam amplification in the plasma to raytrace simulation. Results of transient pumping XRL simulations are presented in this article. The last section is dedicated to a description of the XUV Shack-Hartmann wavefront sensor we have developed, and to the study of the capillary discharge XRL beam.