Impact of Microarchitectural Differences of RISC-V Processor Cores on Soft Error Effects
Impact of Microarchitectural Differences of RISC-V Processor Cores on Soft Error Effects
复制标题
RISC-V 处理器内核的微架构差异对软错误效应的影响
DOI：
10.1109/access.2018.2858773
复制
发表时间：
2018
期刊：
影响因子：
3.9
通讯作者：
Hyungmin Cho
中科院分区：
文献类型：
--
作者：
Hyungmin Cho
在本文中，我们比较了辐射诱导的软错误如何影响实现相同指令集体系结构（ISA）的不同处理器内核上用户级应用程序的执行结果。我们针对两个支持相同RISC-V ISA的处理器核心，但在其微体系进行实现（按处分与排序外）有显着差异。断层注射实验的观察到的结果表明，这两个处理器核的结果效应之间的相关性非常强。在具有不同ISA的处理器核之间未观察到这种强相关性能。基于此观察结果，我们讨论了如何使用少量基准应用的减少故障注入实验来预测软误差对目标处理器核心的产生影响。使用我们在目标处理器核心上选择用于断层注入实验的应用程序的启发式方法，我们实现了高预测准确性，预测误差小于7％。我们的方法可用于对具有相同ISA的系统设计的快速错误弹性评估。
In this paper, we compare how radiation-induced soft errors affect the execution results of user-level applications on different processor cores that implement the same instruction set architecture (ISA). We target two processor cores that support the same RISC-V ISA but have significant differences in their microarchitectural implementations (in-order versus out-of-order). The observed results from fault injection experiments show very strong correlations between the resulting effects from those two processor cores. This strong correlation property is not observed between the processor cores that have different ISAs. Based on this observation, we discuss how the resulting effects of soft errors on a target processor core can be predicted using a reduced set of fault injection experiments with a small number of benchmark applications. Using our heuristic method of selecting the applications to be used for the fault injection experiments on the target processor core, we achieved a high prediction accuracy with prediction errors of less than 7%. Our approach can be used for rapid error resilience evaluation of system designs that have the same ISA.