Dielectric and Piezoelectric Properties of SrBi2−xSmxNb2O9 (x=0, 0.05, 0.1, 0.2, 0.3, and 0.4) Ceramics
Dielectric and Piezoelectric Properties of SrBi2−xSmxNb2O9 (x=0, 0.05, 0.1, 0.2, 0.3, and 0.4) Ceramics
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SrBi2−xSmxNb2O9 (x=0、0.05、0.1、0.2、0.3 和 0.4) 陶瓷的介电和压电性能
DOI:
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发表时间:
2007
期刊:
影响因子:
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通讯作者:
Shi
中科院分区:
文献类型:
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作者:
Lin Sun;Chude Feng;Lidong Chen;Shi
The dielectric and piezoelectric properties of SrBi2−xSmxNb2O9 (x=0, 0.05, 0.1, 0.2, 0.3, and 0.4) ceramics were investigated. SrBi2−xSmxNb2O9 ceramics were synthesized by the conventional solid-state reaction sintering method. An X-ray diffraction measurement indicated that a single-phase-layered perovskite was obtained for all compositions. The substitution of Sm3+ for Bi3+ in the Bi2O2 layers induced a relaxor behavior of frequency dispersion for SrBi2−xSmxNb2O9. The Raman spectra of SrBi2−xSmxNb2O9 revealed that the decrease in Tm could be attributed to smaller structural distortion of NbO6 octahedra that is induced by the substitution of Sm3+ for Bi3+. SrBi2−xSmxNb2O9 (x≤0.2) ceramics are suitable for fine tolerance resonator applications because the Sm3+ doping in Bi2O2 layers can improve the temperature coefficient of resonance frequency.