Theoretical analysis of numerical aperture increasing lens microscopy -: art. no. 053105
Theoretical analysis of numerical aperture increasing lens microscopy -: art. no. 053105
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DOI：
10.1063/1.1858060
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发表时间：
2005-03-01
影响因子：
3.2
通讯作者：
Unl端, MS
中科院分区：
文献类型：
--
作者：
Ippolito, SB;Goldberg, BB;Unl端, MS
我们提出了一个详细的理论分析和实验结果的亚表面显微镜技术，显着提高了聚光，分辨率和放大倍率的传统光学显微镜。数值孔径增大透镜（NAIL）是放置在物体的平坦表面上的平凸透镜，以增强从物体内的次表面结构耦合的光的量。特别地，NAIL允许以超过对象的平面表面的临界角的角度收集否则不可接近的光。因此，数值孔径的限制从传统的亚表面显微镜的单位增加到NAIL显微镜的对象的折射率。球面像差与传统的亚表面显微镜也消除了NAIL。因此，收集的光量和衍射限制的空间分辨率都得到了提高，超出了传统亚表面显微镜的限制。一个理论的光学模型成像结构下的平面表面的对象，无论有和没有NAIL，提出。实验结果表明，地下成像的分辨率的预测改善。(C)2005年美国物理学会。
We present a detailed theoretical analysis and experimental results on a subsurface microscopy technique that significantly improves the light-gathering, resolving, and magnifying power of a conventional optical microscope. The numerical aperture increasing lens (NAIL) is a plano-convex lens placed on the planar surface of an object to enhance the amount of light coupled from subsurface structures within the object. In particular, a NAIL allows for the collection of otherwise inaccessible light at angles beyond the critical angle of the planar surface of the object. Therefore, the limit on numerical aperture increases from unity for conventional subsurface microscopy to the refractive index of the object for NAIL microscopy. Spherical aberration associated with conventional subsurface microscopy is also eliminated by the NAIL. Consequently, both the amount of light collected and diffraction-limited spatial resolution are improved beyond the limits of conventional subsurface microscopy. A theoretical optical model for imaging structures below the planar surface of an object, both with and without a NAIL, is presented. Experimental results demonstrating the predicted improvements in resolution of subsurface imaging are also presented. (C) 2005 American Institute of Physics.