Low Energy Twist Defects in Pentatwinned Silver Nanowires
Low Energy Twist Defects in Pentatwinned Silver Nanowires
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五孪银纳米线中的低能扭曲缺陷
DOI：
10.1002/adem.202300509
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发表时间：
2023
影响因子：
3.6
通讯作者：
Zhao H
中科院分区：
文献类型：
--
作者：
Zhao H
对五股银纳米线网络的透射电子显微镜研究发现，在每根线内存在纳米级的缺陷，显示出垂直于纳米线轴的带状对比狭窄区域(竹子断层)。使用扫描进动电子衍射数据的机器学习分解的结构分析将这些竹子断层识别为一对垂直于线轴的扭曲边界，在断层区域和母体纳米线之间创建了低能量重合的位置晶格。这导致了断层区域内孪晶结构的相对错位的守恒，导致了纳米线的明显局部旋转。在喷涂和非热处理后，它们的存在表明它们可能是在纳米线合成过程中形成的。然而，对循环应变前后的网络的检查发现，缺陷的密度增加，表明它们也可能是机械变形的结果。
Transmission electron microscopy investigation of networks of pentatwinned silver nanowires has identified the presence of nanoscale defects within individual wires, showing narrow regions of banded contrast normal to the nanowire axis (bamboo faults). Structural analysis using machine learning decomposition of scanning precession electron diffraction data identifies these bamboo faults as a pair of twist boundaries normal to the wire axis creating low energy coincident site lattices between the faulted region and the parent nanowire. This leads to a conservation of the relative misorientation of the twinned structure within the faulted region, leading to an apparent local rotation of the nanowire. Their presence after spraying and nonthermal processing suggests that they may form during nanowire synthesis. However, examination of the networks before and after cyclic straining finds an increase in the density of the defects, indicating that they may also form as a result of mechanical deformation.