A method for the automatic calculation of electron density profiles from vertical incidence ionograms

A method for the automatic calculation of electron density profiles from vertical incidence ionograms
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一种根据垂直入射电离图自动计算电子密度剖面的方法

DOI:
10.1016/j.jastp.2013.10.012
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发表时间:
2014
影响因子:
1.9
通讯作者:
Zhou, Chen
Zhou, Chen
中科院分区:
地球科学4区
文献类型:
--
作者:
Zhang, Yuannong;Zhu, Peng;Sun, Hengqing;Zhou, Chen

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Vertical incidence ionograms indicate ionospheric characteristics over the ionosonde station, from which electron density profiles can be derived. This paper describes a method for the automatic calculation of electron density profiles from vertical incidence ionograms. First, the method calculates the initial parameters of the quasi-parabolic segments (QPS) model by using the International Reference Ionosphere (IRI) model, the Nequick2 model, image processing techniques, and the Empirical Orthogonal Function (EOF). Once the initial parameters have been calculated the method then adjusts those to obtain the electron density profiles and synthesized traces that match the recorded ionograms. The algorithm then selects the best-fit synthesized trace and corresponding parameters as output from the candidate ones. Furthermore, the corresponding electron density profile of the recorded ionogram is calculated by using the best-fit parameters of the QPS model. To further test the feasibility of the proposed method, we apply it to some ionograms that were recorded at Wuhan during different seasons. As a result, our results demonstrate that the proposed method is feasible for the automatic calculation of electron density profiles.
DOI: 10.1049/el:19900837
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