Characterizing random one-dimensional media with an embedded reflector via scattered waves
Characterizing random one-dimensional media with an embedded reflector via scattered waves
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通过散射波表征具有嵌入式反射器的随机一维介质
DOI：
10.1103/physrevb.104.104204
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发表时间：
2021
影响因子：
3.7
通讯作者：
["Yiming Huang
中科院分区：
文献类型：
--
作者：
["Yiming Huang
我们在随机矩阵理论、微波测量和计算机模拟中表明，随机介质的平均自由程以及嵌入反射器的强度和位置可以根据系统散射的辐射来确定。反射器的平均自由程和强度由传输统计确定。透射率的统计与反射器的位置无关。然而，反射器的位置可以从从样品一侧入射的波的平均停留时间中找到。
We show in random matrix theory, microwave measurements, and computer simulations that the mean free path of a random medium and the strength and position of an embedded reflector can be determined from radiation scattered by the system. The mean free path and strength of the reflector are determined from the statistics of transmission. The statistics of transmission are independent of the position of the reflector. The reflector’s position can be found, however, from the average dwell time for waves incident from one side of the sample.