Precision measurement of the oscillator strength of the cesium-6 S-2(1/2)-> 5 D-2(5/2) electric quadrupole transition in propagating and evanescent wave fields
Precision measurement of the oscillator strength of the cesium-6 S-2(1/2)-> 5 D-2(5/2) electric quadrupole transition in propagating and evanescent wave fields
复制标题
传播波场和倏逝波场中铯6 S-2(1/2)→5 D-2(5/2)电四极跃迁振子强度的精确测量
DOI：
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发表时间：
2005
期刊：
影响因子：
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通讯作者：
M. Hasuo
中科院分区：
文献类型：
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作者：
S. Tojo;T. Fujimoto;M. Hasuo
Hyperfine-structure-resolved absorption spectra of the 6 {sup 2}S{sub 1/2}{yields}5 {sup 2}D{sub 5/2} of cesium atoms have been observed with a temperature-controlled cell and a diode laser. From a comparison with the absorption of the D{sub 2} transition at the same atom density range, the oscillator strength of the electric quadrupole transition was determined to be (4.69{+-}0.05)x10{sup -7}. Reflection spectra of the same transition have also been observed in the partial and total reflection regimes with a reflection cell. An increase in the apparent oscillator strength was observed for total reflection with an increase in the angle of incidence, by a factor up to 1.5 at {theta}{sub c}+83.8 mrad and 2.4 at {theta}{sub c}+107.5 mrad for s and p polarizations, respectively, where {theta}{sub c} is the critical angle. The observed enhancement is ascribed to the incidence-angle-dependent wave vector and polarization vector of the evanescent wave.
Hyperfine-structure-resolved absorption spectra of the 6 {sup 2}S{sub 1/2}{yields}5 {sup 2}D{sub 5/2} of cesium atoms have been observed with a temperature-controlled cell and a diode laser. From a comparison with the absorption of the D{sub 2} transition at the same atom density range, the oscillator strength of the electric quadrupole transition was determined to be (4.69{+-}0.05)x10{sup -7}. Reflection spectra of the same transition have also been observed in the partial and total reflection regimes with a reflection cell. An increase in the apparent oscillator strength was observed for total reflection with an increase in the angle of incidence, by a factor up to 1.5 at {theta}{sub c}+83.8 mrad and 2.4 at {theta}{sub c}+107.5 mrad for s and p polarizations, respectively, where {theta}{sub c} is the critical angle. The observed enhancement is ascribed to the incidence-angle-dependent wave vector and polarization vector of the evanescent wave.