An accurate dynamical electron diffraction algorithm for reflection high-energy electron diffraction
An accurate dynamical electron diffraction algorithm for reflection high-energy electron diffraction
复制标题
反射高能电子衍射的精确动态电子衍射算法
DOI：
10.1080/14786435.2015.1113323
复制
发表时间：
2015-12-22
影响因子：
1.6
通讯作者：
Wang, Y. G.
中科院分区：
文献类型：
--
作者：
Huang, J.;Cai, C. Y.;Wang, Y. G.
The conventional multislice method (CMS) method, one of the most popular dynamical electron diffraction calculation procedures in transmission electron microscopy, was introduced to calculate reflection high-energy electron diffraction (RHEED) as it is well adapted to deal with the deviations from the periodicity in the direction parallel to the surface. However, in the present work, we show that the CMS method is no longer sufficiently accurate for simulating RHEED with the accelerating voltage 3–100 kV because of the high-energy approximation. An accurate multislice (AMS) method can be an alternative for more accurate RHEED calculations with reasonable computing time. A detailed comparison of the numerical calculation of the AMS method and the CMS method is carried out with respect to different accelerating voltages, surface structure models, Debye–Waller factors and glancing angles.
