Development of an automatic birefringence measuring device of mirror substrates for gravitational wave detectors
Development of an automatic birefringence measuring device of mirror substrates for gravitational wave detectors
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DOI：
10.1088/1742-6596/32/1/066
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发表时间：
2006-03
期刊：
影响因子：
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通讯作者：
M. Tokunari;H. Hayakawa;K. Yamamoto;T. Uchiyama;S. Miyoki;M. Ohashi;K. Kuroda
中科院分区：
文献类型：
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作者：
M. Tokunari;H. Hayakawa;K. Yamamoto;T. Uchiyama;S. Miyoki;M. Ohashi;K. Kuroda
研制了一种适用于激光干涉引力波探测器的合成蓝宝石晶体双折射不均匀性自动测量装置。的c轴的投影在一个平面上的垂直于光束的方向进行了测量，精度为2？十个？2拉德。相位延迟测量的精度为7？十个？4 rad，相当于4？十个？10的折射率波动方面的样品的厚度为150毫米。取向和相位延迟的再现性均为1%。该自动测量装置满足LCGT项目的要求，LCGT项目是用于GW检测的下一代激光干涉仪项目。
We developed an automatic measuring device of birefringence inhomogeneity in synthetic sapphire substrates to evaluate their crystal quality suitable for laser interferometric gravitational wave (GW) detectors. The orientation of the projection of the c-axis on a plane orthogonal to the beam was measured with an accuracy of 2 ? 10?2 rad. The phase retardation was measured with an accuracy of 7 ? 10?4 rad, which was equivalent to 4 ? 10?10 in terms of the fluctuation of the refractive index for samples of 150mm thickness. The reproducibility was 1% for both the orientation and phase retardation. The automatic measuring device meets the requirements of the LCGT project, which is a next-generation laser interferometer project for GW detection.