Apertureless near-field scanning optical microscope based on a quartz tuning fork
Apertureless near-field scanning optical microscope based on a quartz tuning fork
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基于石英音叉的无孔径近场扫描光学显微镜
DOI：
10.1063/1.1593785
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发表时间：
2003
影响因子：
1.6
通讯作者：
L. Aigouy
中科院分区：
文献类型：
--
作者：
Y. D. Wilde;F. Formanek;L. Aigouy
介绍了一种无光阑近场扫描光学显微镜的设计。该系统在轻敲模式下工作，钨针尖安装在石英音叉上，石英音叉周期性地散射样品表面的近场。尖端-音叉结构被做得很短，使得它可以容纳标准的高数值孔径显微镜物镜。我们描述了音叉尖端的安装。在可见光（λ=655 nm）和红外（λ=10.6 μm）下，铬膜中亚波长孔的形貌和光学图像表明ANSOM通常达到几十纳米的分辨率。
The design of an apertureless near-field scanning optical microscope (ANSOM) is presented. The system operates in tapping mode with a tungsten tip mounted on a quartz tuning fork, which periodically scatters the near field at the sample surface. The tip-tuning fork structure is made short so that it can accommodate a standard high numerical aperture microscope objective. We describe the mounting of the tip on the tuning fork. Topographical and optical images, in the visible (λ=655 nm) and in the infrared (λ=10.6 μm), of subwavelength holes in a chromium film demonstrate that the ANSOM routinely achieves a resolution of a few tens of nanometers.