Improving the Testing and Testability of Software Product Lines
Improving the Testing and Testability of Software Product Lines
复制标题
DOI：
10.1007/978-3-642-15579-6_17
复制
发表时间：
2010-09
期刊：
影响因子：
--
通讯作者：
Isis Cabral;Myra B. Cohen;G. Rothermel
中科院分区：
文献类型：
--
作者：
Isis Cabral;Myra B. Cohen;G. Rothermel
软件产品线(SPL)工程在软件产品族的开发中提供了几个优势。然而，仍然需要更好地理解可测试性问题，以及能够在SPL上经济有效地操作的测试技术。在本文中，我们考虑了这些可测试性问题，并强调了可选功能与可选功能之间的一些区别。然后，我们提出了一种基于图的测试方法，称为FIG基本路径方法，它基于特征依赖图来选择要测试的产品和特征。我们对几个非平凡的SPL进行了案例研究，结果表明，对于这些对象，FIG基路径方法与测试所有产品一样有效，但测试的产品不超过SPL中的24%。
Software Product Line (SPL) engineering offers several advantages in the development of families of software products. There is still a need, however, for better understanding of testability issues and for testing techniques that can operate cost-effectively on SPLs. In this paper we consider these testability issues and highlight some differences between optional versus alternative features. We then provide a graph based testing approach called the FIG Basis Path method that selects products and features for testing based on a feature dependency graph. We conduct a case study on several non-trivial SPLs and show that for these subjects, the FIG Basis Path method is as effective as testing all products, but tests no more than 24% of the products in the SPL.