A randomized benchmarking suite for mid-circuit measurements
A randomized benchmarking suite for mid-circuit measurements
复制标题
用于中电路测量的随机基准测试套件
DOI：
10.1088/1367-2630/ad0e19
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发表时间：
2022
影响因子：
3.3
通讯作者：
David C. McKay
中科院分区：
文献类型：
--
作者：
L. Govia;P. Jurcevic;Christopher J Wood;Naoki Kanazawa;Seth T. Merkel;David C. McKay
中路测量是许多量子信息计算协议中的关键组成部分，包括量子误差校正，容忍故障的逻辑操作和基于测量的量子计算。因此，快速有效地表征或基准测试其性能的技术引起了极大的兴趣。除了测量的量子空心外，还要确定中路测量对相邻，未计量的观众量子的影响（如果有）具有什么相关。在这里，我们提出了一个从无处不在的随机基准测试范式开发的中路测量套件。我们展示了如何使用基准测试套件来检测和量化测量值和观众量子的误差，包括观众量子器上的测量诱导的误差以及在测量值和观众尺子之间的纠缠误差。我们通过同时表征来自IBM量子猎鹰设备的多个量子位的中路测量，并通过数值模拟来支持我们的实验结果，从而证明了我们的套件的可扩展性。此外，使用中路测量断层扫描协议，我们确定了通过基准套件确定的错误的性质。
Mid-circuit measurements are a key component in many quantum information computing protocols, including quantum error correction, fault-tolerant logical operations, and measurement based quantum computing. As such, techniques to quickly and efficiently characterize or benchmark their performance are of great interest. Beyond the measured qubit, it is also relevant to determine what, if any, impact mid-circuit measurement has on adjacent, unmeasured, spectator qubits. Here, we present a mid-circuit measurement benchmarking suite developed from the ubiquitous paradigm of randomized benchmarking. We show how our benchmarking suite can be used to both detect as well as quantify errors on both measured and spectator qubits, including measurement-induced errors on spectator qubits and entangling errors between measured and spectator qubits. We demonstrate the scalability of our suite by simultaneously characterizing mid-circuit measurement on multiple qubits from an IBM Quantum Falcon device, and support our experimental results with numerical simulations. Further, using a mid-circuit measurement tomography protocol we establish the nature of the errors identified by our benchmarking suite.
影响因子：
2.9
作者：
Chen, Yanzhu;Farahzad, Maziar;Wei, Tzu-Chieh
通讯作者：
Wei, Tzu-Chieh
影响因子：
16.6
作者：
Livingston, William P.;Blok, Machiel S.;Flurin, Emmanuel;Dressel, Justin;Jordan, Andrew N.;Siddiqi, Irfan
通讯作者：
Siddiqi, Irfan
影响因子：
64.8
作者：
Egan, Laird;Debroy, Dripto M.;Monroe, Christopher
通讯作者：
Monroe, Christopher