Observation of Geometric Phases in Quantum Erasers
Observation of Geometric Phases in Quantum Erasers
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DOI：
10.1143/jpsj.80.034401
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发表时间：
2011-03-01
影响因子：
1.7
通讯作者：
Kitano, Masao
中科院分区：
文献类型：
--
作者：
Kobayashi, Hirokazu;Tamate, Shuhei;Kitano, Masao
在这项研究中，我们报告的几何相位的量子擦除设置的表现。我们的实验包括一个双缝干涉仪的偏振作为一个内部状态的光子。关于干涉条纹的可见性，我们可以证明条纹的消失是通过哪一个路径标记和使用量子擦除器恢复干涉，并且由于偏振态的演化而引起的条纹的相移归因于几何相位或Pancharatnam相位。对于某种排列，几何相位对状态的变化非常敏感，这可以观察到条纹的快速位移。
In this study, we report the manifestation of geometric phases in the setup for quantum erasers. Our experiment includes a double-slit interferometer with the polarization as an internal state of a photon. With regard to the visibility of the interference fringe, we can demonstrate the disappearance of fringes by which-path marking and the recovery of interference using quantum erasers, and the phase shift of the fringe due to the evolution of the polarization state is attributed to the geometric phase or the Pancharatnam phase. For a certain arrangement, the geometric phase can be very sensitive to a change in state and this is observed as a rapid displacement of the fringes.