Dynamics of Hollow Atom Formation in Intense X-Ray Pulses Probed by Partial Covariance Mapping
Dynamics of Hollow Atom Formation in Intense X-Ray Pulses Probed by Partial Covariance Mapping
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DOI：
10.1103/physrevlett.111.073002
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发表时间：
2013-08-13
影响因子：
8.6
通讯作者：
Feifel, R.
中科院分区：
文献类型：
--
作者：
Frasinski, L. J.;Zhaunerchyk, V.;Feifel, R.
当暴露于超高强度的X辐射源，如自由电子激光（FEL）时，最内层的电子壳层可以有效地被清空，产生一个短暂的空心原子或分子。了解飞秒动力学这样的系统是实现非结晶复杂的生物样品的闪光衍射成像原子分辨率的基础。我们证明了一种称为“部分协方差映射”的相关方法的能力，以探测暴露于1062 eV光子的强烈8 fs脉冲的氖原子的电子动力学。一个完整的图片电离过程中的竞争空心原子的形成和衰变是可视化前所未有的轻松和地图揭示了迄今未观察到的非线性序列的光电离和俄歇事件。该技术特别适合自由电子激光实验中固有的高计数率。
When exposed to ultraintense x-radiation sources such as free electron lasers (FELs) the innermost electronic shell can efficiently be emptied, creating a transient hollow atom or molecule. Understanding the femtosecond dynamics of such systems is fundamental to achieving atomic resolution in flash diffraction imaging of noncrystallized complex biological samples. We demonstrate the capacity of a correlation method called "partial covariance mapping'' to probe the electron dynamics of neon atoms exposed to intense 8 fs pulses of 1062 eV photons. A complete picture of ionization processes competing in hollow atom formation and decay is visualized with unprecedented ease and the map reveals hitherto unobserved nonlinear sequences of photoionization and Auger events. The technique is particularly well suited to the high counting rate inherent in FEL experiments.