Total attenuated reflection infrared analysis of silicon-stabilized Tri-calcium phosphate
Total attenuated reflection infrared analysis of silicon-stabilized Tri-calcium phosphate
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DOI：
10.1021/jp0519823
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发表时间：
2005-10-27
影响因子：
3.3
通讯作者：
Shurvell, HF
中科院分区：
文献类型：
--
作者：
Dunfield, D;Sayer, M;Shurvell, HF
基于硅稳定磷酸三钙 [Si-TCP] 的生物陶瓷已通过衰减全反射红外光谱进行了研究，使用的实验准备可确保一致的高质量光谱数据。相位归一化测量表明 OH 带的变化主要是由于羟基磷灰石含量的减少；然而，与磷灰石脱水相关的 945 cm(-1) 处的谱带是可见的，并且与硅掺杂相关。当Si-TCP相的量饱和时，对于小于和大于0.2mol SiO 2 /mol HA的SiO 2 掺杂水平，吸收带随与PO 4 3 - 相关的Si含量的变化是不同的。分辨率的提高使得能够研究与 668、800、863 和 892 cm(-1) 处的 Si 相关的弱能带，并表明 PO43- 的损失与较低掺杂水平下不同硅酸盐基团 SiO4 和较高掺杂水平下新硅物种的发展相一致。
Bioceramics based on silicon stabilized tricalcium phosphate [Si-TCP] have been investigated by attenuated total reflection infrared spectroscopy using an experimental preparation that ensures consistent high-quality spectral data. Phase normalized measurements show that changes in OH bands are primarily due to a decrease in the hydroxyapatite content; however, a band at 945 cm(-1) associated with dehydration of the apatite is visible and correlated with silicon doping. Changes in absorption bands with Si content associated with PO43- differ for SiO2 doping levels less than and greater than 0.2 mol Of SiO2/mol of HA as the amount of Si-TCP phase saturates. Increased resolution allows the study of weak bands linked to Si at 668, 800, 863, and 892 cm(-1) and suggests that the loss Of PO43- coincides with the development of different silicate groups-SiO4 at lower doping levels and a new silicon species at higher doping.