The unacceptable variability in tunnel currents for proposed electronic device applications
The unacceptable variability in tunnel currents for proposed electronic device applications
复制标题
对于所提出的电子设备应用来说，隧道电流的变化不可接受
DOI：
10.1088/0268-1242/21/12/l01
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发表时间：
2006
影响因子：
1.9
通讯作者：
M. Kelly
中科院分区：
文献类型：
--
作者：
M. Kelly
隧道势垒的工程尚未成功到可以进行隧道器件的低成本大批量制造的程度。我们分析了器件性能不可接受的可变性的一个最重要原因，并建议工程隧道势垒不太可能在扩展CMOS路线图方面发挥作用，正如最近所建议的那样。
The engineering of tunnel barriers has not yet succeeded to the point where low cost high volume manufacture of tunnel devices can be undertaken. We analyse one overriding reason for the unacceptable variability in device performance and suggest that engineered tunnel barriers are unlikely to play a role in extending the CMOS Roadmap, as has recently been suggested.